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Creators/Authors contains: "Raghunathan, Shyam"

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  1. ; ; (, IEEE Design & Test)
    This article explores the reliability, security, and sustainability of future 3D NAND flash SSDs. We discuss scaling challenges, their impact on reliability and radiation-induced vulnerabilities, along with potential countermeasures. Security concerns, including data sanitization and supply chain risks, are also discussed. Finally, we highlight sustainability issues related to storage carbon footprints. Our article emphasizes the need for innovative solutions to improve the resilience, security, and environmental impact of 3D NAND technology. 
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